<p id="nxp5x"><big id="nxp5x"><noframes id="nxp5x">

    <var id="nxp5x"><video id="nxp5x"></video></var>

          <em id="nxp5x"></em>

              首 頁 本刊概況 出 版 人 發行統計 在線訂閱 歡迎投稿 市場分析 1 組織交流 1 關于我們
             
            1
               通信短波
            1
               新品之窗
            1
               優秀論文
            1
               通信趨勢
            1
               特別企劃
            1
               運營商動態
            1
               技術前沿
            1
               市場聚焦
            1
               通信視點
            1
               信息化論壇
            1
            當前位置:首頁 > 優秀論文
            三維片上網絡內核測試
            作者:劉剛1,向東2
            來源:本站原創
            更新時間:2013/3/15 10:09:00
            正文:

                       (1. 清華大學計算機系,北京,100084;2. 清華大學軟件學院,北京,100084)

            摘要:片上網絡是一種新興的大規模集成電路的設計方法。片上網絡的測試包括對內核、路由器和通信通道的測試。本文主要提出了一種新的片上網絡內核測試方法。該方法通過重用片上網絡通信結構,采用基于單播的多播數據傳遞方式,以及一種無死鎖的完全自適應路由方法來傳遞測試數據,顯著地提高了通信效率,提升了測試的并行性,降低了測試成本。
            關鍵詞:片上網絡;芯片測試;單播;多播;自適應路由
            中圖分類號:TP206
            The Core-Testing Scheme for 3D Network-on-Chip
            LIU Gang1  XIANG Dong2
            (1. Dept of Computer Science, Tsinghua University, Beijing 100084, China)
            (2. School of Software, Tsinghua University, Beijing 100084, China)
            Abstract: Network-on-chip, or NoC, is a new kind of VLSI design methodology. Testing of NoC includes the testing of cores, routers and channels. In this paper, we present a method for testing the cores in network-on-chips. The delivering of the data is based on the unicast-based multicast steps, and a deadlock-free adaptive routing algorithm, which can significantly increase the efficiency of communication and the degree of parallelism, while cutting down the cost of testing.
            Key words: network-on-chip; IC testing; unicast; multicast; adaptive routing

             


            參考文獻
            (1)Benini L, De Micheli G. Networks on chips: A new SoC paradigm[J]. IEEE Computer, 2002, 35(1): 70-78.
            (2)Cota E and Liu C. Constraint-driven test scheduling for NoC-based systems[J]. IEEE Trans. on Computer-Aided Design, 2006, 25(11): 2465-2478.
            (3)Grecu C, Ivanov A, Saleh R, and Pande P P. Testing network-on-chip communication fabrics[J]. IEEE Trans. on Computer-Aided Design, 2007, 26(12): 2201-2214.
            (4)Salamy H, Harmanani H. An effective solution to thermal-aware test scheduling on network-on-chip using multiple clock rates[C]. IEEE 55th International Midwest Symposium on Circuits and Systems, 2012:530-533.
            (5)Liu C, Iyengar V and Shi J, et al. Power-aware test scheduling in network-on-chip using variable-rate on-chip clocking[C]. Proc. VLSI Test Symp., 2005: 349–354.
            (6)Duato J, Yalamanchili S and Ni L. Interconnection networks: An engineering approach[M]. San Francisco, USA: Morgan Kaufmann Publishers, 2003.
            (7)McKinley P K, Xu H, Hossein A H, and Ni L M. Unicast-based multicast communication in wormhole-routed networks[J]. IEEE Trans. Parallel Distributed Syst., 1994, 5(12): 1252–1265.
            (8)Xiang D. Deadlock-free adaptive routing in meshes with fault-tolerance ability based on channel overlapping[J]. IEEE Trans. on Dependable and Secure Computing, 2011, 8(1): 74-88.
            (9)Linder D H and Harden J C. An adaptive and fault tolerant wormhole routing strategy for k-ary n-cubes[J]. IEEE Trans. on Computers, 1991, 40(1): 2-12.
            (10)Chiu G M. The odd-even turn model for adaptive routing[J]. IEEE Trans. on Parallel and Distributed Systems, 2000, 11(7).
            (11)Palesi M, Patti D and Fazzino F: Noxim – NoC Simulator[OL]. http://noxim.sourceforge.net/
            (12)Duato J. A necessary and sufficient condition for deadlock-free routing in cut-through and store-and-forward networks[J]. IEEE Trans. Parallel and Distributed Systems, 1996, 7(8): 841-854.
            (13)Xiang D and Chen Z. Selective test response collection for low-power scan testing with well-compressed test data[C]. Proc. of 20th IEEE Asian Test Symposium , 2011: 40-45.

             

            作者簡介:
            劉剛:男,1987年生,清華大學計算機系碩士研究生,研究方向包括片上網絡測試、容錯計算等。
            向東:男,1966年生,教授,博士生導師,研究方向為數字系統測試與設計、容錯計算、分布式計

             
             
               
            《通信市場》 中國·北京·復興路49號通信市場(100036) 點擊查看具體位置
            電話:86-10-6820 7724, 6820 7726
            京ICP備05037146號-8
            建議使用 Microsoft IE4.0 以上版本 800*600瀏覽 如果您有什么建議和意見請與管理員聯系
            欧美成人观看免费全部欧美老妇0